NI has introduced a PXIe module source measure unit (SMU) with a measurement sensitivity of 10fA and capable of driving a voltage output up to 200V. The PXIe-4135 SMU has the low-current accuracy and can provide up to 68 channels in a single PXI chassis for wafer-level parametric test, materials research and characterisation of low-current ...
PXIe-based wafer tester has 10fA current sensitivity
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