2015年11月30日 星期一

Boundary scan can be used for chip design

Boundary scan can be used for chip design

XJTAG has introduced the latest version (3.4) of its boundary scan development system, which improves the visibility into complex systems during product development and manufacture. According to the company, because of its ability to interrogate and control JTAG-enabled devices, boundary scan is being used to develop and debug products as well as test them. As ...

Richard Wilson



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