2016年10月21日 星期五

Optical probes work for high speed measurement, says Tektronix

Dean Miles  describes how an optically isolated probe can overcome common mode interference measurement challenges. Advancements in power conversion components have far outpaced the ability to accurately measure and characterise these designs. Engineers working on power device designs involving GaN and SiC technologies and other high-speed applications currently have no way to accurately measure differential ...

Read full article: Optical probes work for high speed measurement, says Tektronix



from News – Electronics Weekly http://ift.tt/2dsLoJi
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