Analog Devices has announced a pair of three-axis MEMS accelerometers intended to detect structural defects via wireless sensor networks. “The low noise of ADXL354 (analogue out) and ADXL355 (digital out) with low power consumption makes it now possible enable low-level vibration measurement applications such as structural health monitoring,” said the firm. Claimed noise density is 25µgravity/√Hz – the analogue ...
Read full article: Accelerometers measure the health of buildings
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