European test service for CMOS image sensors up to 12in in diameter

Creating uniform illumination over a large area makes testing wafer-scale CMOS image sensors tricky, according to San Jose-based Presto Engineering, which has just revealed its computer-controlled solution that illuminates sections of the wafer in turn – working for arrays of large sensors, or even single sensors filling a 12in wafer. “An entire wafer can be ...

This story continues at European test service for CMOS image sensors up to 12in in diameter

Or just read more coverage at Electronics Weekly

from News – Electronics Weekly http://ift.tt/2oTztrA
via Yuichun