2020年3月23日 星期一

Imec signs JDP with Park Systems

Imec and Park Systems, the Atomic Force Microscopy and Metrology specialist, have signed the 2nd Joint Development Project (JDP) within 4 years to increase the development efforts for future generation in-line AFM metrology solutions. Dr. Luc Van den hove (President & CEO, Imec) and Dr. Sang-il Park (Chairman & CEO, Park Systems) The official signing ...

This story continues at Imec signs JDP with Park Systems

Or just read more coverage at Electronics Weekly



from News – Electronics Weekly https://ift.tt/2UndKXG
via Yuichun

沒有留言:

張貼留言