2017年8月31日 星期四

Webinar: Reduce Test Time by implementing Embedded JTAG Solutions

Make a note for your diary - Wednesday 6 September, 10:00am - for a new Electronics Weekly webinar: Combining the Power of Functional Test and Embedded System Access

This story continues at Webinar: Reduce Test Time by implementing Embedded JTAG Solutions

Or just read more coverage at Electronics Weekly



from News – Electronics Weekly http://ift.tt/2wINE7O
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