At IEDM, Renesas described the development of two technologies that reduce the energy and voltage application time for the write operation of STT-MRAM. On a 20Mb test chip with embedded MRAM memory cell array in a 16 nm FinFET logic process, a 72% reduction in write energy and a 50% reduction in the voltage application ...
This story continues at Renesas reduces write energy and voltage application time for STT-MRAM
Or just read more coverage at Electronics Weekly
from News – Electronics Weekly https://ift.tt/3yJwsNj
via Yuichun
沒有留言:
張貼留言