NIWeek: PXI brings fast parallel test to 4G

NI is aiming to make wireless manufacturing test more cost-effective as system move to volume production.

The key is to run test in parallel to improve throughput.

To do this the company has introduced at NIWeek in Austin, Texas today, a multi-standard, multi- DUT and multi-port test system based on the PXI modular instrument platform.

The Wireless Test System (WTS) uses software-designed PXI vector signal transceiver hardware running LabVIEW and TestStand sequencing software.

The scalable RF test platform supports a range of wireless standards including LTE Advanced, 802.11ac Wi-Fi and Bluetooth Low Energy.

It can be used to test multi-standard 3G and 4G hardware which now also incorporates additional short-range wireless connectivity and navigation standards.

Richard Wilson

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