A novel approach from Siemens and PDF Solutions improves yield ramp on advanced nodes and solves yield limiters through volume manufacturing. Improving yield is key to reducing manufacturing cost and maximizing profits in a highly competitive semiconductor market. While large yield limiters are addressed early in the process during yield ramp, subtle systematic layout patterns ...
The post Sponsored Content: A new way to solve systematic circuit failures and boost yield appeared first on Electronics Weekly.
from News | Electronics Weekly https://ift.tt/2pw4a6J
via Yuichun
沒有留言:
張貼留言