Sponsored Content: Packetize test data for no-compromise DFT

Bus-based scan data distribution architecture enables true bottom-up DFT flows, writes Geir Eide of Siemens Digital Industries Software. The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels. The pin-multiplexing (mux) approach ...

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