2018年10月10日 星期三

ST improves debug probe for MCUs

ST has introduced an upgraded STLINK-V3 probe for programming and debugging STM8 and STM32 microcontrollers. The probe now has mass-storage support, a virtual COM port with multipath bridge, and three-times faster write performance. In addition to providing typical JTAG/Serial-Wire Debug (SWD) and Single-Wire Interface Module (SWIM) connections, STLINK-V3’s Virtual COM Port (VCP) and multipath bridge allow ...

This story continues at ST improves debug probe for MCUs

Or just read more coverage at Electronics Weekly



from News – Electronics Weekly https://ift.tt/2IR88ic
via Yuichun

沒有留言:

張貼留言