JTAG Technologies has introduced a JTAG/boundary-scan test hardware interface for multiple interconnects in ATE systems using MAC Panel connection systems. The module provides an interface between the test firm’s PXI and PXIe DataBlasters to the MAC panel ‘Scout’ connection system. Designated JT 2147/eDAK, the module employs the firm’s QuadPod active interface. It provides four independent ...
Read full article: JTAG Technologies module brings PXI into play for hi-rel test
from News – Electronics Weekly http://ift.tt/2t1oCPV
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