At Embedded World 2017, we caught up with Bob Bluhm, vp of value instruments at Rohde & Schwarz, as part of our promotional coverage for the event. He talks about how the company is fortifying its commitment to its value instruments range of products by introducing three innovative entry-level test and measurement products. Thank you ...
Read full article: Embedded World: Video Interview – Rohde & Schwarz on innovation around entry-level T&M instruments
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